The fraction of defective integrated circuits produced in a photolithography process is being studie
Question: The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives.
(a) Calculate the 95% CI on the fraction of defective circuits produced by this particular tool.
(b) Calculate the 95% upper confidence interval on the fraction of defective circuits.
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Answer: The solution consists of 2 pages
Deliverable: Word Document
Deliverable: Word Document
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