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[Solution Library] The time to failure in hours of an electronic component subjected to an accelerated life test is shown in Table 3E.1. To accelerate the

Question: The time to failure in hours of an electronic component subjected to an accelerated life test is shown in Table 3E.1. To accelerate the failure test. the units were tested at an elevated temperature (read down, then across).

  1. Calculate the sample average and standard deviation.
  2. Construct a histogram.
  3. Construct a stem-and-leaf plot.
  4. Find the sample median and the lower and upper quartiles.

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Solution: The downloadable solution consists of 4 pages
Deliverable: Word Document


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